Characterization-1

Langmuir-Blodgett instrument for large-scale assembly of nanowires
Langmuir-Blodgett instrument for large-scale assembly of nanowires
Cascade Microtech automated probe station
Cascade Microtech automated probe station
Desert Cryogenics probe station with vacuum and cryogenic (4.2K) capabilities
Desert Cryogenics probe station with vacuum and cryogenic (4.2K) capabilities
WestBond wire bonder
WestBond wire bonder
JSM 6400 electron-beam lithography platform can write with a minimum feature size of ~100nm in standard e-beam resists on a range of substrates.
JSM 6400 electron-beam lithography platform can write with a minimum feature size of ~100nm in standard e-beam resists on a range of substrates.
BioScope Atomic Force Microscope with inverted optical microscope is used to perform atomic force microscopy measurements on nanostructures and biological samples
BioScope Atomic Force Microscope with inverted optical microscope is used to perform atomic force microscopy measurements on nanostructures and biological samples
MultiMode Scanning Probe Microscope (SPM), with Nanoscope 1 controller (not showing) performs the full range of atomic force microscopy (AFM), including electrostatic force microscopy (EFM), scanning gate microscopy (SGM) and scanning tunneling microscopy (STM) in air
MultiMode Scanning Probe Microscope (SPM), with Nanoscope 1 controller (not showing) performs the full range of atomic force microscopy (AFM), including electrostatic force microscopy (EFM), scanning gate microscopy (SGM) and scanning tunneling microscopy (STM) in air
MultiMode Scanning Probe Microscope (SPM), with Nanoscope 2 controller is used to study topographical, electrical and magnetic properties of nanostructures
MultiMode Scanning Probe Microscope (SPM), with Nanoscope 2 controller is used to study topographical, electrical and magnetic properties of nanostructures