Characterization-1

Langmuir-Blodgett instrument for large-scale assembly of nanowires

Cascade Microtech automated probe station

Desert Cryogenics probe station with vacuum and cryogenic (4.2K) capabilities

WestBond wire bonder

JSM 6400 electron-beam lithography platform can write with a minimum feature size of ~100nm in standard e-beam resists on a range of substrates.

BioScope Atomic Force Microscope with inverted optical microscope is used to perform atomic force microscopy measurements on nanostructures and biological samples

MultiMode Scanning Probe Microscope (SPM), with Nanoscope 1 controller (not showing) performs the full range of atomic force microscopy (AFM), including electrostatic force microscopy (EFM), scanning gate microscopy (SGM) and scanning tunneling microscopy (STM) in air

MultiMode Scanning Probe Microscope (SPM), with Nanoscope 2 controller is used to study topographical, electrical and magnetic properties of nanostructures

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