| INSTRUMENT |
REMARKS |
LOCATION |
| Probe station |
Four probes, CCD camera and LHe flow cryostat |
Characterization-1 |
|
| Computer controlled transport station (1) |
Multichannel DAC/ADC interface, current amplifier, phase lock amplifier |
Characterization-1 |
|
| Semiconductor Parameter Analyzer |
Interfaces with Dell laptop for electrical characterization of devices |
Characterization-1 |
|
| Probe station |
Five probes, microscope, CCD camera and LHe flow cryostat |
Characterization-1 |
|
| Computer controlled transport station (2) |
Multichannel DAC/ACD interface, current amplifier, DC source, multiplexer for study of up to 14 independent inputs simultaneously |
Characterization-1 |
|
| MultiMode Scanning Probe Microscope (SPM) |
Nanoscope 1 controller; equipped for SGM, EFM and related measurements |
Characterization-1 |
|
| AFM |
Inverted lens for study of nanostructures and biological systems |
Characterization-1 |
|
| UHV-LT STM |
Liquid helium temperature, ultrahigh vacuum scanning tunneling microscope equipped with in-house designed electronics and control software |
Characterization-2 |
|
| Optical Microscope |
Bright Field, Dark Field and UV modes; 5x, 20x, 50x and 100x objectives; CCD camera attached to computer for capturing still images and movies |
Characterization-1 |
|
| Optical Microscope |
Bright Field and Dark Field; 5x, 20x and 50x objectives |
Cleanroom |
|
| Automated Probe station |
Wafer scale automated characterization, equipped with computer interface, waveform generator, current amplifier, Tektronix digital oscilloscope, DC source |
Characterization-1 |
|
| Modelocked Ti: Sapphire laser |
Doubling and tripling capability |
Characterization-4 |
|
| Computer controlled optical characterization (1) |
Photoluminescence imaging, BF imaging, photoluminescence spectroscopy, time-resolved photoluminescence spectroscopy |
Characterization-4 |
|
| Ar ion laser |
CW, 100mW power |
Characterization-4 |
|
| Nd:YVO4 UV laser |
λ=266 nm, pulse width <7ns, 35 kHz, 11 µJ/pulse |
Characterization-4 |
|
| Computer controlled optical characterization (2) |
Photoluminescence imaging, BF imaging and photoluminescence spectroscopy |
Characterization-4 |
|
| He-4/He-3 Cryostat |
Variable temperature to 300 mK and magnetic fields up to 10T |
Characterization-3 |
|
| Computer controlled transport station (3) |
DAC/ADC interface card, phase lock amplifiers (2x), switch box for studying multiple devices, DC source (2x) |
Characterization-3 |
|
| He-4 Cryostat |
Variable temperature to 1.5K |
Characterization-1 |
|
| Computer controlled transport station (4) |
DAC/ADC interface card, current amplifier, switch box for studying multiple devices |
Characterization-1 |
